Fault Tolerant and Fault Testable Hardware Design

additional applied approach assignment block called cause check bits checker chips circuit clock code words combinational complex components connected consider consists contains copy correct courtesy of IEEE depends derived detection determined error example fail-safe failed failure fault tolerant Figure function gate given hardware Hence implementation increase indicates information bits initial internal known latch lines logic machine memory method mode module multiple node normal observability obtained occur operation output parity partition path pattern possible present primary input probability problem Proc procedure processor produce realization redundancy reliability respectively response result scan scheme self-checking checker sequence sequential circuits shift shown in Fig shows signal signature single spare switch technique testability totally self-checking transition tree unit variables voter Y₁