Advances in Imaging and Electron PhysicsAdvances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. |
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2PPE aberration correction absorption amplitude Appl beam beamsplitter Boolean Boolean logic chromatic aberration coherent contrast corresponding decoherence demagnetizing density detection detector digraph domain wall dynamics edge electron microscopy emission excitation experimental experiments femtosecond field pulse film frequency input intensity interferometer laser lens Lett logic gates Mach-Zehnder interferometer magnetic field measured metal mode nanoparticle nanotubes Néel wall Nepijko Neutron Interferometry neutron optics nonlinear operator optical logic output parameter particles Pascazio PEEM image Permalloy phase shift photoelectron photoemission photoemission electron photon Phys pixels plasmon platelet polarization processes quantum Rauch reconstruction region resonance rotation sample scanning Schönhense Section shifter shown in Figure signal simulations spatial spectra spectromicroscopy spherical aberration spin stroboscopic structure surface switching synchrotron radiation thermal time-resolved tomography typical ultrafast vector visibility vortex wave width Wigner function X-PEEM X-ray yields Zawisky Zeno
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Page 7 - If the only tool you have is a hammer, you tend to treat every problem as if it were a nail.