Scanning and transmission electron microscopy : an introduction

1: Introduction2: Electron Sources and Electron Lenses2.1: Electron Sources2.2: Electron Lenses3: Vacuum Systems3.1: Vacuum Pumps Commonly Used in EM Labs3.2: Methods of Measuring Vacuums3.3: Vacuum Systems Used in Electron Microscopy4: The Transmission Electron Microscope4.1: Theory of Operation4.2: Real Images4.3: Virtual Images4.4: Depth of Field and Depth of Focus4.5: Anatomy of a Transmission Electron Microscope4.6: Medium- and High-Voltage Transmission Electron Microscopy5: The Scanning Electron Microscope5.1: Theory of Operation5.2: Specimen-Beam Interactions5.3: Machine Variables5.4: Ultrahigh-Resolution SEMS5.5: Environmental SEMS5.7: Scanning Tunneling and Atomic Force Microscopy6: Specimen Preparation for TEM6.1: Negative Staining of Small Particulates6.2: Ultrathin Sectioning of Larger Samples6.3: Vacuum Evaporators and Evaporation Techniques6.4: Shadowcasting and Replica Techniques6.5: Cytological Techniques6.6: Preparation of Nonbiological Materials7: Specimen Preparation for SEM7.1: Mounting7.2: Coating for Conductivity7.3: Special Methods for Various Sample Types7.4: Biological Sample Preparation7.5: Alternative Methods for Biological Samples7.6: SEM Histochemistry for Biological Samples8: X-Ray Analysis8.1: X-ray Production and Naming8.2: Measuring the Energy and Wavelength of X Rays8.3: Construction of the EDS Detector8.4: Construction of the EDS X-Ray Analyzer8.5: Outputs8.6: Spectrum Accumulation and Interpretation8.7: Optimizing the Detection of X Rays8.8: Artifacts8.9: Quantitative Analysis8.10: Sample Preparation9: Electron Micrographic Techniques9.1: Silver Graphic Process9.2: Photographic Printing9.3: Transmission Electron Micrography9.4: Scanning Electron Micrography9.5: The Electronic Darkroom9.6: Micrograph Presentation and Publication